Inventor · Merrimack, NH, US

Wayne Cardoza

15Patents
12h-index
21Co-inventors
74Inventor score

Filing activity: Jul 1, 1987 → Oct 27, 1999

Most-cited inventions

PatentTitleAreaCited byStatus
US5630049A Method and apparatus for testing software on a computer network Physics 164 Expired
US5063497A Apparatus and method for recovering from missing page faults in vector data processing operations Physics 94 Expired
US5008812A Context switching method and apparatus for use in a vector processing system Physics 71 Expired
US5588132A Method and apparatus for synchronizing data queues in asymmetric reflective memories Physics 45 Expired
US5341482A Method for synchronization of arithmetic exceptions in central processing units having pipelined execution units simultaneously executing instructions Physics 42 Expired
US6243744A Computer network cluster generation indicator Physics 41 Expired
US5317717A Apparatus and method for main memory unit protection using access and fault logic signals Physics 40 Expired
US5148544A Apparatus and method for control of asynchronous program interrupt events in a data processing system Physics 37 Expired
US5218712A Providing a data processor with a user-mode accessible mode of operations in which the processor performs processing operations without interruption Physics 37 Expired
US6233668A Concurrent page tables Physics 32 Expired
US5291581A Apparatus and method for synchronization of access to main memory signal groups in a multiprocessor data processing system Physics 18 Expired
US5873120A Variable split virtual address space allocation with multi-system compatibility Physics 14 Expired
US5924122A Method for error recovery spinlock in asymmetrically accessed multiprocessor shared memory Electricity 11 Expired
US5278840A Apparatus and method for data induced condition signalling Physics 9 Expired
US4937824A Apparatus and method for data induced condition signaling General 0 Revoked

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.