Wayne Fitzgerald
7Patents
1h-index
14Co-inventors
48Inventor score
Filing activity: Aug 25, 1998 → Aug 20, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5888050A | Precision high pressure control assembly | Mechanical Engineering; Lighting; Heating | 54 | Expired |
| US11126096B2 | System and method for optimizing a lithography exposure process | Physics | 1 | Active |
| US10466179B2 | Semiconductor device inspection of metallic discontinuities | Physics | 0 | Active |
| US10528961B2 | System and method for estimating a move using object measurements | Physics | 0 | Active |
| US11315832B2 | Wafer singulation process control | Physics | 0 | Active |
| US10553504B2 | Inspection of substrates | Physics | 0 | Active |
| US11531279B2 | System and method for optimizing a lithography exposure process | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.