Patent · US Active

PECVD apparatus for in-situ deposition of film stacks

US10214816B2 · kind B2 · utility

4Cited by
57References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 25, 2014
Grant dateFeb 26, 2019
Priority date
Expiry dateApr 13, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67207
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An apparatus for depositing film stacks in-situ (i.e., without a vacuum break or air exposure) are described. In one example, a plasma-enhanced chemical vapor deposition apparatus configured to deposit a plurality of film layers on a substrate without exposing the substrate to a vacuum break between film deposition phases, is provided. The apparatus includes a process chamber, a plasma source and a controller configured to control the plasma source to generate reactant radicals using a particular reactant gas mixture during the particular deposition phase, and sustain the plasma during a transition from the particular reactant gas mixture supplied during the particular deposition phase to a different reactant gas mixture supplied during a different deposition phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.