Different upper and lower spacers for contact
US10522644B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2018 |
| Grant date | Dec 31, 2019 |
| Priority date | — |
| Expiry date | Jun 21, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/693
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Various processes form different structures including exemplary apparatuses that include (among other components) a first layer having channel regions, source/drain structures in the first layer on opposite sides of the channel regions, a gate insulator on the channel region, and a gate stack on the gate insulator. The gate stack can include a gate conductor, and a stack insulator or a gate contact on the gate conductor. The gate stack has lower sidewalls adjacent to the source/drain structures and upper sidewalls distal to the source/drain structures. Further, lower spacers are between the source/drain contacts and the lower sidewalls of the gate stack; and upper spacers between the source/drain contacts and the upper sidewalls of the gate stack. In some structures, the upper spacers can partially overlap the lower spacers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.