Patent · US Active

Method and apparatus for wiring multiple technology evaluation circuits

US10983159B2 · kind B2 · utility

0Cited by

7References

17Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Stefan Payer · Stuttgart, DE
Michael Klein · Schenefeld, DE
Cedric Lichtenau · Stuttgart, DE
Ralf Richter · Dresden, DE

Key dates

Filing date	Dec 20, 2018
Grant date	Apr 20, 2021
Priority date	—
Expiry date	Jul 4, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318563
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system, apparatus, and method of testing a plurality of test circuits is disclosed that includes inputting experiment data to the plurality of test circuits; applying a control signal to each of the plurality of test circuits to control application of the experiment data to the plurality of test circuits; and shifting the control signal in response to applying the control signal to each of the plurality of test circuits so that a different bit of the control signal is applied to each of the plurality of test circuits. The method in an aspect further comprises reading out a data out signal from each of the plurality of test circuits; and shifting the data out signal in response to reading out the data out signal from each of the plurality of test circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.