Patent · US Active

Methods and apparatus for producing low angle depositions

US11170982B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 1, 2019
Grant dateNov 9, 2021
Priority date
Expiry dateApr 1, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/033
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus for low angle, selective plasma deposition on a substrate. A plasma chamber uses a process chamber having an inner processing volume, a three dimensional (3D) magnetron with a sputtering target with a hollow inner area that overlaps at least a portion of sides of the sputtering target and moves in a linear motion over a length of the sputtering target, a housing surrounding the 3D magnetron and the sputtering target such that at least one side of the housing exposes the hollow inner area of the sputtering target, and a linear channel interposed between the housing and a wall of the process chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.