Low granularity coarse depth test efficiency enhancement
US11250539B2 · kind B2 · utility
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Key dates
| Filing date | Jul 16, 2020 |
| Grant date | Feb 15, 2022 |
| Priority date | — |
| Expiry date | Jul 16, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Briefly, in accordance with one or more embodiments, an apparatus comprises a processor to compute depth values for one or more 4×4 blocks of pixels using 16 source interpolators and 8 destination interpolators on an incoming fragment of pixel data if the destination is in min/max format, and a memory to store a depth test result performed on the one or more 4×4 blocks of pixels. Otherwise the processor is to compute depth values for one or more 8×4 blocks of pixels using 16 source interpolators and 16 destination interpolators if the destination is in plane format.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.