Patent · US Active

Processing of workpieces using ozone gas and hydrogen radicals

US11315801B2 · kind B2 · utility

0Cited by
11References
19Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMay 21, 2021
Grant dateApr 26, 2022
Priority date
Expiry dateMay 21, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32138
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods for processing a workpiece are provided. The workpiece can include a ruthenium layer and a copper layer. In one example implementation, a method for processing a workpiece can include supporting a workpiece on a workpiece support. The method can include performing an ozone etch process on the workpiece to at least a portion of the ruthenium layer. The method can also include performing a hydrogen radical treatment process on a workpiece to remove at least a portion of an oxide layer on the copper layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.