Selective tungsten deposition at low temperatures
US11967525B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2022 |
| Grant date | Apr 23, 2024 |
| Priority date | — |
| Expiry date | Aug 1, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L23/53257
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Embodiments of the disclosure relate to methods of depositing tungsten. Some embodiments of the disclosure provide methods for depositing tungsten which are performed at relatively low temperatures. Some embodiments of the disclosure provide methods in which the ratio between reactant gasses is controlled. Some embodiments of the disclosure provide selective deposition of tungsten. Some embodiments of the disclosure provide methods for depositing tungsten films at a low temperature with relatively low roughness, stress and impurity levels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.