Patent · US Active

Selective tungsten deposition at low temperatures

US11967525B2 · kind B2 · utility

0Cited by
19References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 1, 2022
Grant dateApr 23, 2024
Priority date
Expiry dateAug 1, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L23/53257
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the disclosure relate to methods of depositing tungsten. Some embodiments of the disclosure provide methods for depositing tungsten which are performed at relatively low temperatures. Some embodiments of the disclosure provide methods in which the ratio between reactant gasses is controlled. Some embodiments of the disclosure provide selective deposition of tungsten. Some embodiments of the disclosure provide methods for depositing tungsten films at a low temperature with relatively low roughness, stress and impurity levels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.