Capacitor integrated with a transistor for logic and memory applications
US12274071B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 31, 2023 |
| Grant date | Apr 8, 2025 |
| Priority date | — |
| Expiry date | Jun 9, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B53/30
Abstract
A method of fabricating a device comprises forming a multi-layer stack above a first substrate, where multi-layer stack includes a non-linear polar material. In at least one embodiment, method further includes forming a first conductive layer on multi-layer stack and annealing multi-layer stack. A transistor is formed above a second substrate. In at least one embodiment, method also includes forming a second conductive layer above electrode structure and bonding first conductive layer with second conductive layer. After bonding, method includes removing at least a portion of first substrate patterning multi-layer stack to form a memory device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.