Patent · US Expired

Semiconductor memory

US4901128A · kind A · utility

13Cited by
3References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 24, 1986
Grant dateFeb 13, 1990
Priority date
Expiry dateNov 24, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/665
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory comprises a capacitor with a data storage portion, and an insulated-gate field-effect transistor. The capacitor is formed by a plate which is made up of the side walls and base of a groove formed in a semiconductor substrate, and by a capacitor electrode formed on the side walls and the base, over an insulation film, and which is connected electrically to the source or drain of the insulated-gate field-effect transistor. Various embodiments are provided for reducing size and preventing leakage between other memory cells, including forming stacked capacitors, forming the transistor over the capacitor, using a silicon-over-insulator arrangement for the transistor, forming a common capacitor plate and providing high impurity layers within the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.