Tokuo Kure
61Patents
24h-index
124Co-inventors
91Inventor score
Filing activity: May 21, 1982 → Oct 18, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4985114A | Dry etching by alternately etching and depositing | Emerging Cross-Sectional Technologies | 545 | Expired |
| US5177576A | Dynamic random access memory having trench capacitors and vertical transistors | Electricity | 118 | Expired |
| US5412210A | Scanning electron microscope and method for production of semiconductor device by using the same | Electricity | 88 | Expired |
| US5196910A | Semiconductor memory device with recessed array region | Electricity | 79 | Expired |
| US5188976A | Manufacturing method of non-volatile semiconductor memory device | Electricity | 78 | Expired |
| US4970564A | Semiconductor memory device having stacked capacitor cells | Electricity | 76 | Expired |
| US5481109A | Surface analysis method and apparatus for carrying out the same | Electricity | 72 | Expired |
| US4882289A | Method of making a semiconductor memory device with recessed array region | Emerging Cross-Sectional Technologies | 70 | Expired |
| US5140389A | Semiconductor memory device having stacked capacitor cells | Electricity | 56 | Expired |
| US5091761A | Semiconductor device having an arrangement of IGFETs and capacitors stacked thereover | Electricity | 56 | Expired |
| US4529476A | Gas for selectively etching silicon nitride and process for selectively etching silicon nitride with the gas | Electricity | 52 | Expired |
| US5594245A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 47 | Expired |
| US4937641A | Semiconductor memory and method of producing the same | Electricity | 46 | Expired |
| US5053849A | Transistor with overlapping gate/drain and two-layered gate structures | Electricity | 43 | Expired |
| US4751557A | Dram with FET stacked over capacitor | Electricity | 42 | Expired |
| US5296729A | Semiconductor memory device having static random access memory | Emerging Cross-Sectional Technologies | 39 | Expired |
| US5658811A | Method of manufacturing a semiconductor device | Electricity | 38 | Expired |
| US4635090A | Tapered groove IC isolation | Emerging Cross-Sectional Technologies | 37 | Expired |
| US5352324A | Etching method and etching apparatus therefor | Electricity | 37 | Expired |
| US6114695A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 35 | Expired |
| US5877498A | Method and apparatus for X-ray analyses | Electricity | 32 | Expired |
| US5357464A | Semiconductor memory having writing and reading transistors, method of fabrication thereof, and method of use thereof | Electricity | 30 | Expired |
| US4396460A | Method of forming groove isolation in a semiconductor device | Electricity | 25 | Expired |
| US5866904A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 24 | Expired |
| US5969357A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 23 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.