Patent · US Expired

Method for evaluating decoupling capacitor placement for VLSI chips

US6323050A · kind A · utility

11Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 2, 2000
Grant dateNov 27, 2001
Priority date
Expiry dateOct 2, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of evaluating decoupling capacitor placement for Very Large Scale Integrated Chips (VLSI) is disclosed. Included in the method is an analysis of the usage for each decoupling capacitor, the distance from the devices, and the locations of the devices and decoupling capacitors. Also addressed are the orientations and size of the components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.