Patent · US Expired

Method of forming thermally stable polycrystal to single crystal electrical contact structure

US6429101B1 · kind B1 · utility

1Cited by
18References
57Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 29, 1999
Grant dateAug 6, 2002
Priority date
Expiry dateJan 29, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02255
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a thermally stable ohmic contact structure that includes a region of monocrystalline semiconductor and a region of polycrystalline semiconductor. At least one region of dielectric material is formed between at least a portion of the region of monocrystalline semiconductor and the region of polycrystalline semiconductor, thereby controlling grain growth of the polycrystalline semiconductor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.