Chemical-mechanical planarization of metallurgy
US6632377B1 · kind B1 · utility
47Cited by
22References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 30, 1999 |
| Grant date | Oct 14, 2003 |
| Priority date | — |
| Expiry date | Sep 30, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/3212
- WIPO fieldBasic materials chemistry
- WIPO sectorChemistry
Abstract
Copper or a copper alloy is removed by chemical-mechanical planarization (CMP) in a slurry of an oxidizer, an oxidation inhibitor, and an additive that appreciably regulates copper complexing with the oxidation inhibitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.