Patent · US Expired

Memory architecture

US6639824B1 · kind B1 · utility

7Cited by
2References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 2002
Grant dateOct 28, 2003
Priority date
Expiry dateSep 19, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An IC with memory cells arranged in groups is described. The memory cells, for example, are ferroelectric memory cells. The IC includes a variable voltage generator (VVG) for generating an output voltage having a different voltage level depending on a location of an addressed memory cell within the memory group is provided. By providing different voltage levels for reads and/or writes, signal loss caused by capacitances which is dependent on the location of the memory cell within the group can be avoided. This improves read and/or write operations in series memory architectures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.