Norbert Rehm
18Patents
3h-index
14Co-inventors
49Inventor score
Filing activity: Apr 26, 2002 → May 22, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6999887B2 | Memory cell signal window testing apparatus | Physics | 8 | Expired |
| US6639824B1 | Memory architecture | Physics | 7 | Expired |
| US6920059B2 | Reducing effects of noise coupling in integrated circuits with memory arrays | Physics | 4 | Expired |
| US7170804B2 | Test mode for detecting a floating word line | Physics | 3 | Expired |
| US7457177B2 | Random access memory including circuit to compress comparison results | Physics | 3 | Active |
| US7299388B2 | Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer | Physics | 3 | Expired |
| US6731529B2 | Variable capacitances for memory cells within a cell group | Electricity | 3 | Expired |
| US7085191B2 | Simulating a floating wordline condition in a memory device, and related techniques | Physics | 3 | Expired |
| US6687171B2 | Flexible redundancy for memories | Physics | 3 | Expired |
| US7313033B2 | Random access memory including first and second voltage sources | Physics | 2 | Expired |
| US6707699B1 | Historical information storage for integrated circuits | Physics | 2 | Expired |
| US7171156B2 | Method and apparatus for transmitting audio and non-audio information with error correction | Electricity | 2 | Expired |
| US7408833B2 | Simulating a floating wordline condition in a memory device, and related techniques | Physics | 1 | Active |
| US7539911B2 | Test mode for programming rate and precharge time for DRAM activate-precharge cycle | Physics | 1 | Expired |
| US6856560B2 | Redundancy in series grouped memory architecture | Physics | 1 | Expired |
| US6903959B2 | Sensing of memory integrated circuits | Physics | 1 | Expired |
| US6906969B2 | Hybrid fuses for redundancy | Physics | 1 | Expired |
| US7362632B2 | Test parallelism increase by tester controllable switching of chip select groups | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.