Patent · US Expired

System and method for product yield prediction using a logic characterization vehicle

US6834375B1 · kind B1 · utility

222Cited by
5References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2002
Grant dateDec 21, 2004
Priority date
Expiry dateOct 8, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A characterization vehicle includes at least one combinatorial logic circuit element, and a control circuit that controls the combinatorial logic circuit element. The control circuit includes an input mechanism for inputting a test pattern of signals into the combinatorial logic circuit element. An output mechanism stores an output pattern that is output by the combinatorial logic circuit element based on the test pattern. A ring bus connects the output means to the input means so as to cause oscillation. A counter counts a frequency of the oscillation, thereby to measure performance of the combinatorial logic circuit element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.