Patent · US Expired

Method for concurrently producing at least a pair of semiconductor structures that each include at least one useful layer on a substrate

US7115481B2 · kind B2 · utility

6Cited by
3References
21Claims
0Family size

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Key dates

Filing dateOct 14, 2003
Grant dateOct 3, 2006
Priority date
Expiry dateOct 14, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for concurrently producing at least a pair of semiconductor structures that each include at least one useful layer on a substrate. The method includes providing an initial structure that includes a useful layer having a front face on a support substrate. Atomic species are implanted into the useful layer to a controlled mean implantation depth to form a zone of weakness within the useful layer that defines first and second useful layers. Next, a stiffening substrate is bonded to the front face of the initial structure. The first useful layer is then detached from the second useful layer along the zone of weakness to obtain a pair of semiconductor structures with a first structure including the stiffening substrate and the first useful layer and a second structure including the support substrate and the second useful layer. The structures obtained can be used in the fields of electronics, optoelectronics or optics.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.