Patent · US Expired

Semiconductor integrated circuit device

US7166893B2 · kind B2 · utility

19Cited by
12References
46Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 23, 2002
Grant dateJan 23, 2007
Priority date
Expiry dateOct 18, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/981
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A MISFET capable of a high speed operation includes a metal silicide layer in a high concentration region aligned with a gate side wall layer on a self-alignment basis. A MISFET which can be driven at a high voltage includes an LDD portion having a width greater than the width of the side wall layer, a high concentration region in contact with the LDD portion and a metal silicide layer in the high concentration region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.