Minimizing adjacent wordline disturb in a memory device
US7257024B2 · kind B2 · utility
10Cited by
15References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 4, 2006 |
| Grant date | Aug 14, 2007 |
| Priority date | — |
| Expiry date | May 4, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/0483
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A selected wordline that is coupled to cells for programming is biased with a programming voltage. The unselected wordlines that are adjacent to the selected wordline are biased at a first predetermined voltage. The remaining wordlines are biased at a second predetermined voltage that is greater than the first predetermined voltage. The first predetermined voltage is selected by determining what unselected, adjacent wordline bias voltage produces a minimized Vpass disturb in response to the selected wordline programming voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.