Patent · US Expired

Method and apparatus for providing uniform plasma in a magnetic field enhanced plasma reactor

US7374636B2 · kind B2 · utility

14Cited by
87References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 26, 2002
Grant dateMay 20, 2008
Priority date
Expiry dateAug 1, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3266
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for controlling a magnetic field gradient within a magnetically enhanced plasma reactor. The apparatus comprises a cathode pedestal supporting a wafer within an enclosure, a plurality of electromagnets positioned proximate the enclosure for producing a magnetic field in the enclosure and a magnetic field control element, positioned proximate the electromagnets, for controlling the magnetic field proximate a specific region of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.