Chuck for holding a device under test
US7492172B2 · kind B2 · utility
8Cited by
764References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 21, 2004 |
| Grant date | Feb 17, 2009 |
| Priority date | — |
| Expiry date | Apr 21, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.