Patent · US Expired

Recycling by mechanical means of a wafer comprising a multilayer structure after taking-off a thin layer thereof

US7602046B2 · kind B2 · utility

2Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2005
Grant dateOct 13, 2009
Priority date
Expiry dateMay 14, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76254
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a recyclable donor wafer that includes a substrate and a formed layer thereon, wherein the formed layer has a thickness sufficient to provide (a) at least two useful layers for detachment therefrom and (b) additional material that can be removed to planarize exposed surfaces of the useful layers prior to detachment from the donor wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.