Patent · US Active

Wafer level chip scale package and process of manufacture

US7955893B2 · kind B2 · utility

8Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2008
Grant dateJun 7, 2011
Priority date
Expiry dateJul 26, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/30107
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Power wafer level chip scale package (CSP) and process of manufacture are enclosed. The power wafer level chip scale package includes all source, gate and drain electrodes located on one side of the device, which is convenient for mounting to a printed circuit board (PCB) with solder paste.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.