Patent · US Active

Double-sided integrated circuit chips

US8013342B2 · kind B2 · utility

16Cited by
15References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2007
Grant dateSep 6, 2011
Priority date
Expiry dateApr 24, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19041
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A double-sided integrated circuit chips, methods of fabricating the double-sided integrated circuit chips and design structures for double-sided integrated circuit chips. The method includes removing the backside silicon from two silicon-on-insulator wafers having devices fabricated therein and bonding them back to back utilizing the buried oxide layers. Contacts are then formed in the upper wafer to devices in the lower wafer and wiring levels are formed on the upper wafer. The lower wafer may include wiring levels. The lower wafer may include landing pads for the contacts. Contacts to the silicon layer of the lower wafer may be silicided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.