Methods for forming resistive switching memory elements by heating deposited layers
US8143092B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Mar 9, 2009 |
| Grant date | Mar 27, 2012 |
| Priority date | — |
| Expiry date | Mar 13, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B63/80
Abstract
Resistive switching nonvolatile memory elements are provided. A metal-containing layer and an oxide layer for a memory element can be heated using rapid thermal annealing techniques. During heating, the oxide layer may decompose and react with the metal-containing layer. Oxygen from the decomposing oxide layer may form a metal oxide with metal from the metal-containing layer. The resulting metal oxide may exhibit resistive switching for the resistive switching memory elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.