Patent · US Active

In-situ deposition of film stacks

US8741394B2 · kind B2 · utility

15Cited by
13References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2010
Grant dateJun 3, 2014
Priority date
Expiry dateAug 11, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67207
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods for depositing film stacks by plasma enhanced chemical vapor deposition are described. In one example, a method for depositing a film stack on a substrate, wherein the film stack includes films of different compositions and the deposition is performed in a process station in-situ, is provided. The method includes, in a first plasma-activated film deposition phase, depositing a first layer of film having a first film composition on the substrate; in a second plasma-activated deposition phase, depositing a second layer of film having a second film composition on the first layer of film; and sustaining the plasma while transitioning a composition of the plasma from the first plasma-activated film deposition phase to the second plasma-activated film deposition phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.