Patent · US Active

Method of forming a semiconductor structure including a vertical nanowire

US8835255B2 · kind B2 · utility

4Cited by
0References
20Claims
0Family size

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Inventors

Key dates

Filing dateJan 23, 2013
Grant dateSep 16, 2014
Priority date
Expiry dateApr 11, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/122
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method comprises providing a semiconductor structure comprising a substrate and a nanowire above the substrate. The nanowire comprises a first semiconductor material and extends in a vertical direction of the substrate. A material layer is formed above the substrate. The material layer annularly encloses the nanowire. A first part of the nanowire is selectively removed relative to the material layer. A second part of the nanowire is not removed. A distal end of the second part of the nanowire distal from the substrate is closer to the substrate than a surface of the material layer so that the semiconductor structure has a recess at the location of the nanowire. The distal end of the nanowire is exposed at the bottom of the recess. The recess is filled with a second semiconductor material. The second semiconductor material is differently doped than the first semiconductor material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.