Patent · US Active

Wafer level chip scale package and process of manufacture

US8981464B2 · kind B2 · utility

4Cited by
10References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 6, 2014
Grant dateMar 17, 2015
Priority date
Expiry dateMay 6, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/30107
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Power wafer level chip scale package (CSP) and process of manufacture are enclosed. The power wafer level chip scale package includes all source, gate and drain electrodes located on one side of the device, which is convenient for mounting to a printed circuit board (PCB) with solder paste.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.