Patent · US Active

Middle-of-the-line constructs using diffusion contact structures

US9006100B2 · kind B2 · utility

8Cited by
1References
14Claims
0Family size

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Key dates

Filing dateAug 7, 2012
Grant dateApr 14, 2015
Priority date
Expiry dateAug 7, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An approach for providing MOL constructs using diffusion contact structures is disclosed. Embodiments include: providing a first diffusion region in a substrate; providing, via a first lithography process, a first diffusion contact structure; providing, via a second lithography process, a second diffusion contact structure; and coupling the first diffusion contact structure to the first diffusion region and the second diffusion contact structure. Embodiments include: providing a second diffusion region in the substrate; providing a diffusion gap region between the first and second diffusion regions; providing the diffusion contact structure over the diffusion gap region; and coupling, via the diffusion contact structure, the first and second diffusion regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.