Patent · US Active

Semiconductor processing system including vaporizer and method for using same

US9159548B2 · kind B2 · utility

1Cited by
1References
9Claims
0Family size

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Key dates

Filing dateNov 22, 2013
Grant dateOct 13, 2015
Priority date
Expiry dateJan 8, 2034

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/52
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for using a system, which includes a film formation apparatus for forming a high-dielectric constant thin film on target substrates together and a gas supply apparatus for supplying a process gas. The method includes a preparatory stage of determining a set pressure range of pressure inside a vaporizing chamber for a liquid material cooled at a set temperature. The preparatory stage includes obtaining a first limit value of pressure at which vaporization of the liquid material starts being inhibited due to an increase in the pressure, obtaining a second limit value of pressure at which vaporization of the liquid material starts being unstable and the pressure starts pulsating movement due to a decrease in the pressure, and determining the set pressure range to be defined by an upper limit lower than the first limit value and a lower limit higher than the second limit value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.