Selection of data for redundancy calculation by likely error rate
US9177673B2 · kind B2 · utility
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24References
17Claims
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Key dates
| Filing date | Oct 28, 2013 |
| Grant date | Nov 3, 2015 |
| Priority date | — |
| Expiry date | Dec 6, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0411
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Layers in a multi-layer memory array are categorized according to likely error rates as predicted from their memory hole diameters. Data to be stored along a word line in a high risk layer is subject to a redundancy operation (e.g. XOR) with data to be stored along a word line in a low risk layer so that the risk of both being bad is low.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.