Pao-Ling Koh
19Patents
8h-index
28Co-inventors
68Inventor score
Filing activity: Jan 29, 2010 → Jun 20, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8730722B2 | Saving of data in cases of word-line to word-line short in memory arrays | Physics | 34 | Active |
| US8902661B1 | Block structure profiling in three dimensional memory | Electricity | 20 | Active |
| US9633738B1 | Accelerated physical secure erase | Physics | 13 | Active |
| US8902658B1 | Three-dimensional NAND memory with adaptive erase | Physics | 12 | Active |
| US9015407B1 | String dependent parameter setup | Physics | 10 | Active |
| US10007311B2 | Adaptive temperature and memory parameter throttling | Emerging Cross-Sectional Technologies | 10 | Active |
| US8964467B1 | Systems and methods for partial page programming of multi level cells | Physics | 10 | Active |
| US9911500B2 | Dummy voltage to reduce first read effect in memory | Physics | 8 | Active |
| US9646709B2 | Proxy wordline stress for read disturb detection | Physics | 7 | Active |
| US9741444B2 | Proxy wordline stress for read disturb detection | Physics | 4 | Active |
| US9136022B2 | Selection of data for redundancy calculation by likely error rate | Physics | 4 | Active |
| US8107298B2 | Non-volatile memory with fast binary programming and reduced power consumption | Physics | 2 | Active |
| US8929141B1 | Three-dimensional NAND memory with adaptive erase | Physics | 2 | Active |
| US9063671B2 | Write operations with full sequence programming for defect management in nonvolatile memory | Physics | 2 | Active |
| US9058881B1 | Systems and methods for partial page programming of multi level cells | Physics | 2 | Active |
| US9218886B2 | String dependent parameter setup | Physics | 2 | Active |
| US9129701B2 | Asymmetric state detection for non-volatile storage | Physics | 1 | Active |
| US10971199B2 | Microcontroller for non-volatile memory with combinational logic | Physics | 0 | Active |
| US9177673B2 | Selection of data for redundancy calculation by likely error rate | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.