Patent · US Active

Method for manufacturing a fin MOS transistor

US9673329B2 · kind B2 · utility

0Cited by
2References
12Claims
0Family size

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Key dates

Filing dateDec 4, 2015
Grant dateJun 6, 2017
Priority date
Expiry dateDec 4, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/215

Abstract

A fin MOS transistor is made from an SOI-type structure that includes a semiconductor layer on a silicon oxide layer coating a semiconductor support. A trench formed from the surface of the semiconductor layer delimits at least one fin in the semiconductor layer, that trench extending at least to an upper surface of the semiconductor support. Etched recesses in sides of a portion of the silicon oxide layer located under the fin are filled with a material selectively etchable over silicon oxide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.