Method for manufacturing a fin MOS transistor
US9673329B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 4, 2015 |
| Grant date | Jun 6, 2017 |
| Priority date | — |
| Expiry date | Dec 4, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/215
Abstract
A fin MOS transistor is made from an SOI-type structure that includes a semiconductor layer on a silicon oxide layer coating a semiconductor support. A trench formed from the surface of the semiconductor layer delimits at least one fin in the semiconductor layer, that trench extending at least to an upper surface of the semiconductor support. Etched recesses in sides of a portion of the silicon oxide layer located under the fin are filled with a material selectively etchable over silicon oxide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.