Yves Morand
50Patents
6h-index
51Co-inventors
75Inventor score
Filing activity: Dec 29, 1998 → Apr 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8470689B2 | Method for forming a multilayer structure | Performing Operations; Transporting | 197 | Active |
| US7598145B2 | Method for producing Si1-yGey based zones with different contents in Ge on a same substrate by condensation of germanium | Electricity | 49 | Active |
| US6521533B1 | Method for producing a copper connection | Electricity | 16 | Expired |
| US7041539B2 | Method for making an island of material confined between electrodes, and application to transistors | Emerging Cross-Sectional Technologies | 15 | Expired |
| US9117805B2 | Air-spacer MOS transistor | Electricity | 12 | Active |
| US7829916B2 | Transistor with a germanium-based channel encased by a gate electrode and method for producing one such transistor | Electricity | 10 | Active |
| US6875686B2 | Method for fabricating a structure of interconnections comprising an electric insulation including air or vacuum gaps | Electricity | 6 | Expired |
| US7141837B2 | High-density MOS transistor | Electricity | 6 | Expired |
| US9502558B2 | Local strain generation in an SOI substrate | Electricity | 4 | Active |
| US7129563B2 | Method of fabricating a semiconductor device comprising a gate dielectric made of high dielectric permittivity material | Electricity | 4 | Expired |
| US6734483B2 | Process for fabricating a capacitor within an integrated circuit, and corresponding integrated circuit | Electricity | 3 | Expired |
| US9269570B2 | Contact on a heterogeneous semiconductor substrate | Electricity | 3 | Active |
| US7361592B2 | Method for producing a component comprising at least one germanium-based element and component obtained by such a method | Electricity | 3 | Active |
| US9899217B2 | Method for producing a strained semiconductor on insulator substrate | Electricity | 2 | Active |
| US8962399B2 | Method of making a semiconductor layer having at least two different thicknesses | Electricity | 2 | Active |
| US9935019B2 | Method of fabricating a transistor channel structure with uniaxial strain | Electricity | 2 | Active |
| US10014183B2 | Method for patterning a thin film | Electricity | 2 | Active |
| US6228765A | Structure and method for forming conductive members in an integrated circuit | Electricity | 2 | Expired |
| US9425051B2 | Method for producing a silicon-germanium film with variable germanium content | Electricity | 2 | Active |
| US7972971B2 | Method for producing Si1-yGey based zones with different contents in Ge on a same substrate by condensation of germanium | Electricity | 2 | Active |
| US9536951B2 | FinFET transistor comprising portions of SiGe with a crystal orientation [111] | Electricity | 1 | Active |
| US9711567B2 | Process for fabricating an integrated circuit cointegrating a FET transistor and an OxRAM memory location | Electricity | 1 | Active |
| US9276073B2 | Nanowire and planar transistors co-integrated on utbox SOI substrate | Emerging Cross-Sectional Technologies | 1 | Active |
| US8722471B2 | Method for forming a via contacting several levels of semiconductor layers | Electricity | 1 | Active |
| US7625811B2 | Method for producing distinct first and second active semi-conducting zones and use thereof for fabricating C-MOS structures | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.