Semiconductor wafer probing system including pressure sensing and control unit
US9702930B2 · kind B2 · utility
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15References
20Claims
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Key dates
| Filing date | Apr 5, 2016 |
| Grant date | Jul 11, 2017 |
| Priority date | — |
| Expiry date | Apr 5, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07364
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wafer probing system includes a probe card assembly having a plurality of individual probe structures configured make contact with a semiconductor wafer mounted on a motor driven wafer chuck, with each probe structure configured with a pressure sensing unit integrated therewith; and a controller configured to drive the probe card assembly with one or more piezoelectric driver units response to feedback from the pressure sensing units of the individual probe structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.