Tso-Hui Ting
15Patents
3h-index
12Co-inventors
49Inventor score
Filing activity: Dec 4, 2007 → Apr 5, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8237278B2 | Configurable interposer | Emerging Cross-Sectional Technologies | 19 | Active |
| US7856332B2 | Real time system for monitoring the commonality, sensitivity, and repeatability of test probes | Physics | 12 | Active |
| US8742782B2 | Noncontact electrical testing with optical techniques | Physics | 4 | Active |
| US8159247B2 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Electricity | 3 | Active |
| US9524930B2 | Configurable interposer | Emerging Cross-Sectional Technologies | 2 | Active |
| US8299809B2 | In-line characterization of a device under test | Physics | 1 | Active |
| US8963567B2 | Pressure sensing and control for semiconductor wafer probing | Physics | 1 | Active |
| US8489225B2 | Wafer alignment system with optical coherence tomography | Electricity | 1 | Active |
| US7908023B2 | Method of establishing a lot grade system for product lots in a semiconductor manufacturing process | Emerging Cross-Sectional Technologies | 1 | Active |
| US9354252B2 | Pressure sensing and control for semiconductor wafer probing | Physics | 1 | Active |
| US9151781B2 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Electricity | 0 | Active |
| US9702930B2 | Semiconductor wafer probing system including pressure sensing and control unit | Physics | 0 | Active |
| US8429193B2 | Security control of analysis results | Electricity | 0 | Active |
| US8759152B2 | Configurable interposer | Emerging Cross-Sectional Technologies | 0 | Active |
| US9780007B2 | LCR test circuit structure for detecting metal gate defect conditions | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.