Patent · US Active

Method for producing strained semi-conductor blocks on the insulating layer of a semi-conductor on insulator substrate

US9761607B2 · kind B2 · utility

2Cited by
0References
10Claims
0Family size

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Key dates

Filing dateDec 22, 2014
Grant dateSep 12, 2017
Priority date
Expiry dateDec 22, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/85
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a microelectronic device is provided, including forming on an insulating layer of a semi-conductor on insulator type substrate, a first semi-conductor block covered with a first strain zone configured to induce a compressive strain in the first block and a second semi-conductor block covered with a second strain zone configured to induce a tensile strain in the second block, the first block and the second block each being formed of a lower region based on amorphous semi-conductor material, covered with an upper region of crystalline semi-conductor material in contact with one of the strain zones; and recrystallizing the lower region of the first and second blocks while using the upper region of crystalline material as starting zone for a recrystallization front.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.