Method for doping source and drain regions of a transistor by means of selective amorphisation
US9966453B2 · kind B2 · utility
2Cited by
2References
13Claims
0Family size
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Key dates
| Filing date | Apr 6, 2016 |
| Grant date | May 8, 2018 |
| Priority date | — |
| Expiry date | May 19, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/26513
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Method including the steps consisting in:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.