Nanofocus AG
9Patents
7Active
9Granted
41Portfolio score
Filing activity: Jan 11, 2001 → Jul 12, 2017 · 4 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8153338B2 | Apparatus and method for repairing photo mask | Physics | 4 | Active |
| US8023184B2 | Device and method for high-intensity uniform illumination with minimal light reflection for use in microscopes | Physics | 2 | Active |
| US6943823B2 | Method and device for producing height images of technical surfaces with microscopic resolution | Physics | 2 | Expired |
| US8014053B2 | Method for generating a universal pinhole pattern for use in confocal microscopes | Physics | 1 | Active |
| US10222414B2 | Apparatus and method for exchanging probe | Physics | 0 | Active |
| US6853459B2 | Scanning using position transmission for triggering the recording of measured values | Physics | 0 | Expired |
| US10627214B2 | Method for electronically analyzing a signal changing over time | Physics | 0 | Active |
| US11029143B2 | Method and device for optical surface measurement by means of a chromatic confocal sensor | Physics | 0 | Active |
| US8434159B2 | AFM measuring method and system thereof | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.