On-Chip Technologies, Inc.
9Patents
2Active
9Granted
31Portfolio score
Filing activity: Mar 24, 1999 → Jun 18, 2008 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6687865B1 | On-chip service processor for test and debug of integrated circuits | Physics | 69 | Expired |
| US7197681B2 | Accelerated scan circuitry and method for reducing scan test data volume and execution time | Physics | 25 | Expired |
| US7353470B2 | Variable clocked scan test improvements | Physics | 20 | Active |
| US7188286B2 | Accelerated scan circuitry and method for reducing scan test data volume and execution time | Physics | 19 | Expired |
| US7200784B2 | Accelerated scan circuitry and method for reducing scan test data volume and execution time | Physics | 18 | Expired |
| US6964001B2 | On-chip service processor | Physics | 8 | Expired |
| US7080301B2 | On-chip service processor | Physics | 4 | Expired |
| US7234092B2 | Variable clocked scan test circuitry and method | Physics | 4 | Expired |
| US7797595B2 | Serially decoded digital device testing | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.