QC Solutions, Inc.
13Patents
0Active
13Granted
29Portfolio score
Filing activity: Mar 1, 1995 → Mar 14, 2006
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5661408A | Real-time in-line testing of semiconductor wafers | Electricity | 88 | Expired |
| US6388455B1 | Method and apparatus for simulating a surface photo-voltage in a substrate | Physics | 43 | Expired |
| US6325078A | Apparatus and method for rapid photo-thermal surface treatment | Emerging Cross-Sectional Technologies | 21 | Expired |
| US6069017A | Method for real-time in-line testing of semiconductor wafers | Electricity | 19 | Expired |
| US6315574A | Method for real-time in-line testing of semiconductor wafers | Electricity | 16 | Expired |
| US6803588B2 | Apparatus and method for rapid photo-thermal surfaces treatment | Emerging Cross-Sectional Technologies | 10 | Expired |
| US6911350B2 | Real-time in-line testing of semiconductor wafers | Electricity | 7 | Expired |
| US6909302B2 | Real-time in-line testing of semiconductor wafers | Electricity | 3 | Expired |
| US7403023B2 | Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered. | Electricity | 2 | Expired |
| US7119569B2 | Real-time in-line testing of semiconductor wafers | Physics | 2 | Expired |
| US7160742B2 | Methods for integrated implant monitoring | Electricity | 1 | Expired |
| US6967490B1 | Real-time in-line testing of semiconductor wafers | Electricity | 1 | Expired |
| US6924657B2 | Real-time in-line testing of semiconductor wafers | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.