Ajay Pai
14Patents
4h-index
17Co-inventors
57Inventor score
Filing activity: Nov 14, 2002 → Dec 2, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7616804B2 | Wafer edge inspection and metrology | Physics | 13 | Active |
| US8426223B2 | Wafer edge inspection | Physics | 7 | Active |
| US8492178B2 | Method of monitoring fabrication processing including edge bead removal processing | Physics | 7 | Active |
| US6870897B2 | Method for identification of cotton contaminants with x-ray microtomographic image analysis | Physics | 6 | Expired |
| US8175372B2 | Wafer edge inspection and metrology | Physics | 4 | Active |
| US10372093B2 | Comfort mapping using wearables | Physics | 2 | Active |
| US10691083B2 | Thermostat system for remote reading, setting, and control of devices | Electricity | 2 | Active |
| US7865010B2 | Wafer edge inspection and metrology | Physics | 2 | Active |
| US8818074B2 | Wafer edge inspection and metrology | Physics | 1 | Active |
| US9062859B2 | Wafer edge inspection illumination system | Physics | 1 | Active |
| US11156375B2 | Migration of settings from a non-connected building controller to another building controller | Electricity | 0 | Active |
| US12113000B2 | Lead adapters for semiconductor package | Electricity | 0 | Active |
| US11846438B2 | Migration of settings from a non-connected building controller to another building controller | Electricity | 0 | Active |
| US11650555B2 | Bluetooth thermostat and hub | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.