Andrei Brunfeld
22Patents
10h-index
12Co-inventors
72Inventor score
Filing activity: May 14, 1991 → Dec 17, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6294793A | High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor | Physics | 49 | Expired |
| US7253891B2 | Method and apparatus for simultaneous 2-D and topographical inspection | Physics | 29 | Expired |
| US7170605B2 | Active sensor and method for optical illumination and detection | Performing Operations; Transporting | 27 | Expired |
| US6629772B2 | Method and apparatus for illumination and entertainment by light emitted from a guide via scattering | Emerging Cross-Sectional Technologies | 26 | Expired |
| US6879421B2 | Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator | Physics | 20 | Expired |
| US7576862B2 | Measuring time dependent fluorescence | Physics | 15 | Expired |
| US7214932B2 | Resonator method and system for distinguishing characteristics of surface features or contaminants | Physics | 14 | Expired |
| US5459576A | Differential phase contrast inspection system | Physics | 12 | Expired |
| US6262432A | High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method therefor | Physics | 11 | Expired |
| US6252242A | High speed optical inspection apparatus using Gaussian distribution analysis and method therefore | Physics | 10 | Expired |
| US5189489A | Interferometric measurement device with non stabilized light source | Physics | 10 | Expired |
| US7193725B2 | Method and system for optical measurement via a resonator having a non-uniform phase profile | Physics | 9 | Expired |
| US7330277B2 | Resonant ellipsometer and method for determining ellipsometric parameters of a surface | Physics | 9 | Expired |
| US7102740B2 | Method and system for determining surface feature characteristics using slit detectors | Physics | 7 | Expired |
| US7022978B2 | Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system | Physics | 7 | Expired |
| US5638175A | Differential phase contrast inspection system with multiple detectors | Physics | 5 | Expired |
| US7220955B2 | Three-dimensional imaging resonator and method therefor | Physics | 4 | Expired |
| US7671978B2 | Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts | Physics | 4 | Active |
| US8436997B2 | Optical inspection system with polarization isolation of detection system reflections | Physics | 2 | Active |
| US7812956B2 | Time dependent fluorescence measurements | Physics | 2 | Active |
| US6255666A | High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor | Physics | 1 | Expired |
| US7294825B2 | Fabry-perot resonator apparatus and method including an in-resonator polarizing element | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.