Asher Pearl
8Patents
4h-index
8Co-inventors
42Inventor score
Filing activity: Sep 3, 1999 → Mar 22, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6521891B1 | Focusing method and system | Electricity | 35 | Expired |
| US6545275B1 | Beam evaluation | Electricity | 12 | Expired |
| US7105843B1 | Method and system for controlling focused ion beam alignment with a sample | Electricity | 5 | Expired |
| US7427753B2 | Method of cross-section milling with focused ion beam (FIB) device | Electricity | 4 | Active |
| US7800062B2 | Method and system for the examination of specimen | Electricity | 4 | Active |
| US7385205B2 | Method and device for aligning a charged particle beam column | Electricity | 3 | Active |
| US7335893B2 | Method and device for aligning a charged particle beam column | Electricity | 2 | Expired |
| US6914386B2 | Source of liquid metal ions and a method for controlling the source | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.