Brian Murphy
16Patents
8h-index
10Co-inventors
69Inventor score
Filing activity: Jan 22, 1992 → Dec 13, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6570785B1 | Method of reducing disturbs in non-volatile memory | Physics | 84 | Expired |
| US6717851B2 | Method of reducing disturbs in non-volatile memory | Physics | 71 | Expired |
| US5455527A | CMOS buffer circuit with controlled current source | Electricity | 30 | Expired |
| US5166546A | Integrated circuit for generating a reset signal | Electricity | 19 | Expired |
| US6977844B2 | Method of reducing disturbs in non-volatile memory | Physics | 13 | Expired |
| USD727750S1 | Three compartment package | General | 11 | Active |
| US6888752B2 | Method of reducing disturbs in non-volatile memory | Physics | 9 | Expired |
| US5381056A | CMOS buffer having output terminal overvoltage-caused latch-up protection | Electricity | 9 | Expired |
| US10707226B1 | Source side program, method, and apparatus for 3D NAND | Electricity | 4 | Active |
| US6463559B1 | Non-volatile fault indicator | Physics | 3 | Expired |
| US5386157A | MOS output buffer circuit with controlled current source | Electricity | 1 | Expired |
| US6019302A | Method and apparatus for indicating end of useful life for tape cartridges | Physics | 1 | Expired |
| US7145804B2 | Method of reducing disturbs in non-volatile memory | Physics | 1 | Expired |
| US11830564B2 | Detecting bit line open circuits and short circuits in memory device with memory die bonded to control die | Electricity | 0 | Active |
| US7468915B2 | Method of reducing disturbs in non-volatile memory | Physics | 0 | Active |
| US12084246B2 | Double sealed packaging and method of manufacturing the same | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.