Inventor · Milpitas, CA, US

Ching-Hwa Chen

22Patents
13h-index
29Co-inventors
81Inventor score

Filing activity: May 19, 1983 → Nov 5, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US5356478A Plasma cleaning method for removing residues in a plasma treatment chamber Electricity 820 Expired
US5226967A Plasma apparatus including dielectric window for inducing a uniform electric field in a plasma chamber Electricity 380 Expired
US5234526A Window for microwave plasma processing device Electricity 376 Expired
US5368710A Method of treating an article with a plasma apparatus in which a uniform electric field is induced by a dielectric window Electricity 116 Expired
US5198725A Method of producing flat ECR layer in microwave plasma device and apparatus therefor Electricity 95 Expired
US5812361A Dynamic feedback electrostatic wafer chuck Emerging Cross-Sectional Technologies 64 Expired
US7122415B2 Atomic layer deposition of interpoly oxides in a non-volatile memory device Electricity 54 Expired
US5824605A Gas dispersion window for plasma apparatus and method of use thereof Electricity 43 Expired
US7910429B2 Method of forming ONO-type sidewall with reduced bird's beak Electricity 29 Expired
US6337277B1 Clean chemistry low-k organic polymer etch Electricity 25 Expired
US6221792A Metal and metal silicide nitridization in a high density, low pressure plasma reactor Electricity 24 Expired
US4513453A Pre-tied necktie Human Necessities 19 Expired
US4897887A Preknotted adjustable necktie Human Necessities 14 Expired
US7001810B2 Floating gate nitridation Electricity 11 Expired
US4835794A Preset necktie Emerging Cross-Sectional Technologies 11 Expired
US4856114A Seaman style preset necktie Human Necessities 6 Expired
US6787415B1 Nonvolatile memory with pedestals Electricity 5 Expired
US7387972B2 Reducing nitrogen concentration with in-situ steam generation Electricity 3 Expired
US7297597B2 Method for simultaneously fabricating ONO-type memory cell, and gate dielectrics for associated high voltage write transistors and gate dielectrics for low voltage logic transistors by using ISSG Electricity 3 Expired
US8283733B2 Semiconductor devices with gate electrodes and with monocrystalline silicon regions that contain atoms of nitrogen and one or more of chlorine, bromine, sulfur, fluorine, or phosphorus Electricity 1 Active
US7851339B2 Method of repairing deep subsurface defects in a silicon substrate that includes diffusing negatively charged ions into the substrate from a sacrificial oxide layer Electricity 1 Active
US7807577B2 Fabrication of integrated circuits with isolation trenches Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.