Chuan Liu
11Patents
4h-index
37Co-inventors
60Inventor score
Filing activity: Nov 3, 1998 → Nov 1, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6268269A | Method for fabricating an oxide layer on silicon with carbon ions introduced at the silicon/oxide interface in order to reduce hot carrier effects | Electricity | 36 | Expired |
| US6555485B1 | Method for fabricating a gate dielectric layer | Electricity | 17 | Expired |
| US6653856B1 | Method of determining reliability of semiconductor products | Physics | 10 | Expired |
| US6072677A | Electrostatic discharge protective circuit formed by use of a silicon controlled rectifier | Electricity | 9 | Expired |
| US6249139A | Lifetime measurement of an ultra-thin dielectric layer | Physics | 4 | Expired |
| US6269315A | Reliability testing method of dielectric thin film | Physics | 2 | Expired |
| US6570388B2 | Transmission line pulse method for measuring electrostatic discharge voltages | Physics | 2 | Expired |
| US9718802B2 | Crystal form of dabigatran etexilate mesylate and preparation method and use thereof | Chemistry; Metallurgy | 0 | Active |
| US10782220B1 | Cross-scale wide-spectrum particle size plugging formula granularity analysis method | Physics | 0 | Active |
| US11391145B2 | Dynamic fracture width calculation method for drilling fluid loss in fractured formation | Physics | 0 | Active |
| US11017134B1 | Quantitative scoring and optimization method of drilling and completion loss-control material | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.