Chuanjiang Chen
6Patents
0h-index
4Co-inventors
24Inventor score
Filing activity: Aug 11, 2021 → Jun 20, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12361196B2 | DRC test pattern generation method and apparatus, electronic device, and storage medium | Physics | 0 | Active |
| US11989499B2 | Method and apparatus for adjusting metal wiring density | Electricity | 0 | Active |
| US12423497B2 | Layout repairing method and apparatus, computer device, and storage medium | Electricity | 0 | Active |
| US11983480B2 | Check tool and check method for design rule check rule deck of integrated circuit layout | Physics | 0 | Active |
| US12164852B2 | Layout method and layout apparatus for integrated circuit | Physics | 0 | Active |
| US12242791B2 | Semiconductor integrated circuit design method and apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.